Image analysis system and operating method of the same

[특허 요약] Disclosed is an image analysis system which includes a first analyzer and a second analyzer. The first analyzer generates first features by encoding images through a first model and adjusts a weight of the first model based on the first features. The second analyzer generates second features based on the first features by encoding the images through a second model, classifies the second features into classes, respectively, and adjusts a weight of the second model based on mutual information and a correlation between a first class among the classes which features corresponding to an original image group from among the second features are classified as and a second class among the classes which features corresponding to an augmentation group of the original image group from among the second features are classified as.

특허 등록번호

12164602B

특허 출원번호

202117375650

출원일

2021.07.14

등록일

2024.12.10

국가

미국

출원인

기초과학연구원

발명자

Meeyoung Cha, Sungwon Han, Sungwon PARK, Sundong KIM, Sungkyu PARK

중요 키워드

features, model, images, weight, analysis system