[특허 요약] Provided is an in-situ X-ray analysis apparatus including a potentiostat connected to an in-situ electrochemical cell and configured to adjust voltage, current, and time of the in-situ electrochemical cell or to record information regarding voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information regarding the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive signals to or from the X-ray analysis apparatus and the potentiostat.

등록번호

10876980B

출원번호

201916263495

출원인

서울대학교산학협력단, 충남대학교산학협력단, 기초과학연구원

키워드

situ, ray analysis, electrochemical cell, information, overpotential